Difference between revisions of "ATK Processor Testing Procedures"

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Line 23: Line 23:
 
     start -> tested
 
     start -> tested
 
      
 
      
     tested -> epost [label="NO"]
+
     tested -> epost [label="YES"]
     tested -> equiptest [label="YES"]
+
     tested -> equiptest [label="NO"]

Revision as of 15:39, 31 July 2007

<graphviz>

 digraph H {
    node [fontname="Helvetica", fontsize="11"]
    edge [fontname="Helvetica"]
   start           [label="START HERE", shape="box", style="bold"]
   tested          [label="Has the test equipment you're going to use been tested?"]
   epost           [label="Did the test equipment POST?"]
   equiptest       [label="Follow the EQUIPMENT TEST PROCEDURES and return here.", shape="box"]
   trouble         [label="Troubleshoot test equipment with TROUBLESHOOTING GUIDE and return here.", shape="box"]
   remove          [label="Remove the cooling unit (HSF) from test processor and set it aside. Return the test processor to the testing kit and replace with the processor to be tested.", style="box"]
   badtest         [label="Replace bad test component and return here.', style="box"]
   810             [label="Follow steps 8-10 from the EQUIPMENT TEST PROCEDURES.", style="box"]
   1516            [label="Follow steps 15 & 16 from the EQUIPMENT TEST PROCEDURES.", style="box"]
   spost           [label="Did the system POST?"]
   trouble2        [label="Troubleshoot processor with TROUBLESHOOTING GUIDE and return here.", shape="box"]
   advanced        [label="Follow ADVANCED TESTING PROCEDURES.", style="bold", shape="box"]
   recognized      [label="Was the processor properly recognized?"]
   badcpu          [label="The processor is bad, recycle it.", style="bold", shape="box"]


   start -> tested
   
   tested -> epost [label="YES"]
   tested -> equiptest [label="NO"]