Difference between revisions of "ATK Processor Testing Procedures"
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<graphviz> | <graphviz> | ||
| − | digraph | + | digraph { |
node [fontname="Helvetica", fontsize="11"] | node [fontname="Helvetica", fontsize="11"] | ||
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trouble [label="Troubleshoot test\nequipment with\nTROUBLESHOOTING GUIDE\nand return here.", shape="hexagon"] | trouble [label="Troubleshoot test\nequipment with\nTROUBLESHOOTING GUIDE\nand return here.", shape="hexagon"] | ||
badtest [label="Replace bad test\ncomponent and\nreturn here.", shape="hexagon"] | badtest [label="Replace bad test\ncomponent and\nreturn here.", shape="hexagon"] | ||
| − | remove [label="Remove the cooling\nunit (HSF) from test\nprocessor and set it aside.\nReturn the test processor\nto the testing kit | + | remove [label="Remove the cooling\nunit (HSF) from test\nprocessor and set it aside.\nReturn the test processor\nto the testing kit.", shape="box"] |
| − | + | process [label="Follow the Processor Testing process.\n(wiki.freegeek.org/index.php/Processor_Testing)", shape="box", style="bold"] | |
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badtest -> equiptest | badtest -> equiptest | ||
| − | remove -> | + | remove -> process |
| − | + | } | |
| − | + | </graphviz> | |
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| − | + | [[Category:Advanced Testing Kit]] | |
Latest revision as of 13:58, 10 August 2007
