Difference between revisions of "ATK Processor Testing Procedures"
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epost2 [label="Did the test\nequipment POST?", shape="diamond"] | epost2 [label="Did the test\nequipment POST?", shape="diamond"] | ||
equiptest [label="Follow the EQUIPMENT\nTEST PROCEDURES\nand return here.", shape="octagon"] | equiptest [label="Follow the EQUIPMENT\nTEST PROCEDURES\nand return here.", shape="octagon"] | ||
| − | trouble [label="Troubleshoot test\nequipment with\nTROUBLESHOOTING GUIDE\nand return here.", shape=" | + | trouble [label="Troubleshoot test\nequipment with\nTROUBLESHOOTING GUIDE\nand return here.", shape="octagon"] |
badtest [label="Replace bad test\ncomponent and\nreturn here.", shape="octagon"] | badtest [label="Replace bad test\ncomponent and\nreturn here.", shape="octagon"] | ||
remove [label="Remove the cooling\nunit (HSF) from test\nprocessor and set it aside.\nReturn the test processor\nto the testing kit and\nreplace with the processor\nto be tested.", shape="box"] | remove [label="Remove the cooling\nunit (HSF) from test\nprocessor and set it aside.\nReturn the test processor\nto the testing kit and\nreplace with the processor\nto be tested.", shape="box"] | ||
Revision as of 11:02, 1 August 2007
